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CDB42L55
6 PERFORMANCE PLOTS
Test conditions (unless otherwise specified): T A = 25°C; VA=VCP=VLDO=VL=1.8 V; input test signal is a full-scale
997 Hz sine wave; dB values relative to full-scale output; measurement bandwidth 20 Hz to 20 kHz (un-weighted);
sample frequency = 48 kHz; +2 dB analog gain for Line Output path; -4 dB analog gain for Headphone Output path;
headphone test load: R L = 16 ? ; no LPF option for Headphone Output path.
-60
-65
-70
-60
-65
-70
d
B
F
S
-75
-80
-85
-90
-95
d
B
F
S
-75
-80
-85
-90
-95
-100
20
50
100
200
500
1k
2k
5k
10k 20k
-100
-60
-50
-40
-30
-20
-10
Hz
Figure 10. THD+N vs Freq. - Analog In to Digital Out
+0
-20
-40
dBr
Figure 11. THD+N vs Amplitude - Analog In to Digital Out
+0
-20
-40
d
B
F
S
-60
-80
-100
-120
d
B
F
S
-60
-80
-100
-120
-140
20
50
100
200
500
1k
2k
5k
10k 20k
-140
20
50
100
200
500
1k
2k
5k
10k 20k
Hz
Figure 12. FFT - Analog In to Digital Out @ -1 dBFS
Hz
Figure 13. FFT - Analog In to Digital Out @ -60 dBFS
Note:
DS773DB1
The total harmonic distortion + noise (THD+N) performance of the ADC in the CS42L55 is determined
by the value of the capacitor on the FILT+ pin. Larger capacitor values yield significant improvement
in THD+N at low frequencies. Fig. 10 shows the THD+N vs. frequency performance measured with a
2.2 μF capacitor.
19
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